Issues for deep level models of bulk damage to silicon detectors
نویسنده
چکیده
A brief review of the current data is given and some of the major unresolved issues i n the understanding of radiation damage to silicon detectors are highlighted, concentrating mainly on damage to the silicon bulk. The importance of experimental tests of the deep level models being developed is stressed as a key to further progress.
منابع مشابه
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تاریخ انتشار 1999